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Koh Young Technology Showcasing its Inspection Solutions at electronica and SEMICON Europa in Munich
Alzenau, Germany – Koh Young Technology, the global leader in True 3D measurement-based inspection solutions, will demonstrate its award-winning inspection solutions at Messe München on November 12-15, 2024. At electronica Booth A3.358, our team of experts will be on hand to discuss how our AOI, SPI and DPI solutions boost your quality and increase your yield. At the parallel event SEMICON Europa Booth C2.549, our application engineering team will be showcasing our superior quality semiconductor inspection solutions for advanced and wafer-level packaging.
















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