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Test & Measurement | November 23, 2006

SPEA and JTAG integrates test methods

SPEA S.p.A. and JTAG Technologies have announced the integration of their test methods within the SPEA 3030 in-circuit test system.
The companies said that electronics designers and manufacturers will benefit from a greater testability and programmability of complex PCBs, all within a single process step.

Andrea Ganio, Executive Director of SPEA, says, "Our customers have asked us to integrate boundary-scan into our products. In order to meet this request for high-performance digital testing, we are very pleased to collaborate with JTAG Technologies in offering an integrated solution. Customers will gain greater test coverage while maintaining a consistent user interface."

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