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SMT & Inspection | November 22, 2005

FEINFOCUS and Xradia introduce advanced Micro-CT X-ray inspection

FEINFOCUS, a COMET business unit and leading manufacturer of high-resolution microfocus X-ray inspection systems, and Xradia, a developer of ultra high-resolution X-ray imaging systems for 3D tomography, announce a new advanced 3D X-ray inspection technology for the Semiconductor Packaging and Medical Device industries.
Click here to read the full story on EMSnow.com

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