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Test & Measurement | May 16, 2008

ASSET joins Mentor OpenDoor Program

ASSET InterTech has joined the Mentor Graphics OpenDoor Program in order to ensure toolset interoperability for embedded instrumentation applications.
Through the program ASSET and Mentor will enable the exchange of data between Mentor’s chip-level inserted design–for-test (DFT) structures, such as the JTAG infrastructure, and ASSET’s ScanWorks platform, which automates, accesses and analyzes embedded instrumentation and DFT data.

“Initial efforts will include interoperability testing for both the original boundary scan standard, IEEE 1149.1, as well as the newer IEEE 1149.6 standard that specifies a test methodology for high-speed, differential interconnects. Future work will enable ScanWorks to access internal test structures and embedded instruments inserted into chips with Mentor Graphics’ DFT tools through JTAG ports at the chip, board and system levels.

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